Invention Grant
- Patent Title: Analyzing spectral data for the selection of a calibration model
- Patent Title (中): 分析校准模型选择的光谱数据
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Application No.: US12736929Application Date: 2009-05-06
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Publication No.: US08494818B2Publication Date: 2013-07-23
- Inventor: Philippe Hubert , Eric Ziemons , François Moonen
- Applicant: Philippe Hubert , Eric Ziemons , François Moonen
- Applicant Address: BE Angleur BE Liège
- Assignee: Université de Liège,Arlenda s.a.
- Current Assignee: Université de Liège,Arlenda s.a.
- Current Assignee Address: BE Angleur BE Liège
- Agency: Jacobson Holman PLLC
- Priority: EP08157099 20080528
- International Application: PCT/EP2009/055504 WO 20090506
- International Announcement: WO2009/144124 WO 20091203
- Main IPC: G06F17/10
- IPC: G06F17/10

Abstract:
The invention relates to a method of analyzing spectral data for the selection of a calibration model, relating spectra of a substance to a physical or chemical parameter of the substance, over a predetermined range of the physical or chemical parameter, comprising the steps: a) capturing spectral data of the substance with respective values of the physical or chemical parameter over the predetermined range, b) creating a plurality of calibration models using the captured spectral data in dependence upon the values of the physical or chemical parameter based on the calibration data using statistical resampling methods, c) calculating tolerance intervals of the results at each reference level for each calibration model, and d) displaying the tolerance intervals at each reference level over the predetermined range for each calibration model. In this way, a possibility for analyzing spectra data is provided which is useful in spectroscopic applications for automated calibration model selection and makes analytical interpretation and evaluation easier and more accurate.
Public/Granted literature
- US20110071807A1 ANALYSING SPECTRAL DATA FOR THE SELECTION OF A CALIBRATION MODEL Public/Granted day:2011-03-24
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