Invention Grant
US08495425B2 System and method to efficiently identify bad components in a multi-node system utilizing multiple node topologies
失效
使用多节点拓扑来有效地识别多节点系统中的不良组件的系统和方法
- Patent Title: System and method to efficiently identify bad components in a multi-node system utilizing multiple node topologies
- Patent Title (中): 使用多节点拓扑来有效地识别多节点系统中的不良组件的系统和方法
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Application No.: US13037891Application Date: 2011-03-01
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Publication No.: US08495425B2Publication Date: 2013-07-23
- Inventor: David W. Alderman , Mitchell D. Felton , Karl M. Solie
- Applicant: David W. Alderman , Mitchell D. Felton , Karl M. Solie
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Stachler Intellectual Property Law LLC
- Main IPC: G06F11/30
- IPC: G06F11/30

Abstract:
The exemplary embodiments of the present invention provide a method for efficiently identifying the bad component(s) in a multi-node system. The method includes assigning a unique ID to each of a plurality of nodes on the multi-node system, generating test statistics from a test on a plurality of nodes, and comparing the test statistics for the plurality of nodes against a first topology to generate a first number of clusters of bad nodes. The method further includes comparing the test statistics for the plurality of nodes against a second topology to generate a second number of clusters of bad nodes, and identifying the bad nodes by comparing the cluster sizes to a topology threshold.
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