Invention Grant
US08495575B2 Systems and methods for analyzing test coverage at an organizational level 有权
在组织层面分析测试覆盖的系统和方法

  • Patent Title: Systems and methods for analyzing test coverage at an organizational level
  • Patent Title (中): 在组织层面分析测试覆盖的系统和方法
  • Application No.: US12633806
    Application Date: 2009-12-09
  • Publication No.: US08495575B2
    Publication Date: 2013-07-23
  • Inventor: Stefan RauUwe Bloching
  • Applicant: Stefan RauUwe Bloching
  • Applicant Address: DE Walldorf
  • Assignee: SAP AG
  • Current Assignee: SAP AG
  • Current Assignee Address: DE Walldorf
  • Main IPC: G06F9/44
  • IPC: G06F9/44
Systems and methods for analyzing test coverage at an organizational level
Abstract:
Disclosed are methods and systems for calculating test coverage of a software organizational schema. The method and systems involve retrieving the software organizational schema associated with an application, receiving an assigned weight factor to the one or more software organizational schema components associated with the application, determining a number of processed code lines and a total number of the code lines associated with the one or more software organizational schema components, calculating a test coverage for the one or more software organizational schema components based on the weight factor, the number of processed code lines and the total number of code lines of the software organizational schema component.
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