Invention Grant
- Patent Title: System and method for wafer level packaging
- Patent Title (中): 晶圆级封装的系统和方法
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Application No.: US13183272Application Date: 2011-07-14
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Publication No.: US08497558B2Publication Date: 2013-07-30
- Inventor: Ulrich Krumbein , Gerhard Lohninger , Alfons Dehe
- Applicant: Ulrich Krumbein , Gerhard Lohninger , Alfons Dehe
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater & Matsil, L.L.P.
- Main IPC: G01L9/00
- IPC: G01L9/00 ; H01L21/00

Abstract:
In an embodiment, a semiconductor device includes a semiconductor substrate. The semiconductor substrate has a first cavity disposed through it, and conductive material covers at least the bottom portion of the first cavity. An integrated circuit is disposed on the top surface of the conductive material. The device further includes a cap disposed on the top surface of the substrate, such that a cavity disposed on a surface of the cap overlies the first cavity in the substrate.
Public/Granted literature
- US20130015467A1 System and Method for Wafer Level Packaging Public/Granted day:2013-01-17
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