Invention Grant
- Patent Title: Magnetic detection apparatus
- Patent Title (中): 磁检测装置
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Application No.: US12907599Application Date: 2010-10-19
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Publication No.: US08497674B2Publication Date: 2013-07-30
- Inventor: Yoshinori Tatenuma , Hideki Shimauchi , Masahiro Yokotani , Yuji Kawano , Hiroshi Kobayashi , Kazuyasu Nishikawa , Manabu Tsukamoto
- Applicant: Yoshinori Tatenuma , Hideki Shimauchi , Masahiro Yokotani , Yuji Kawano , Hiroshi Kobayashi , Kazuyasu Nishikawa , Manabu Tsukamoto
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-098769 20100422
- Main IPC: G01R33/02
- IPC: G01R33/02 ; G01B7/30

Abstract:
A magnetic detection apparatus includes a first comparison circuit that waveform-shapes the amplitude of a detection signal from magneto-electric transducers by DC coupling, a third comparison circuit that waveform-shapes the detection signal by AC coupling, an oscillation circuit having a natural frequency, a control circuit that counts the output of the first comparison circuit by using the oscillation means, and a selection circuit that selects the output of the first comparison means and the output of the second comparison means. The control circuit counts rising from the next rising or falling from the next falling of an output rectangular wave of the first comparison circuit, and provides output to the selection circuit at the time point at which the count value reaches a desired value. The selection circuit selects and outputs the output rectangular wave of the first comparison circuit or the third comparison circuit.
Public/Granted literature
- US20110260724A1 MAGNETIC DETECTION APPARATUS Public/Granted day:2011-10-27
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