Invention Grant
US08497712B2 Techniques for measuring voltages in a circuit 有权
测量电路电压的技术

  • Patent Title: Techniques for measuring voltages in a circuit
  • Patent Title (中): 测量电路电压的技术
  • Application No.: US13475937
    Application Date: 2012-05-18
  • Publication No.: US08497712B2
    Publication Date: 2013-07-30
  • Inventor: Andy NguyenLing Yu
  • Applicant: Andy NguyenLing Yu
  • Applicant Address: US CA San Jose
  • Assignee: Altera Corporation
  • Current Assignee: Altera Corporation
  • Current Assignee Address: US CA San Jose
  • Agent Steven J. Cahill
  • Main IPC: H03K5/22
  • IPC: H03K5/22
Techniques for measuring voltages in a circuit
Abstract:
A circuit includes a comparator, a programmable current source, and a control circuit. The comparator is operable to compare an internal supply voltage of the circuit to a reference voltage. The programmable current source is operable to supply a first current for the reference voltage. The control circuit is operable to control the first current through the programmable current source based on an output signal of the comparator.
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