Invention Grant
- Patent Title: Techniques for measuring voltages in a circuit
- Patent Title (中): 测量电路电压的技术
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Application No.: US13475937Application Date: 2012-05-18
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Publication No.: US08497712B2Publication Date: 2013-07-30
- Inventor: Andy Nguyen , Ling Yu
- Applicant: Andy Nguyen , Ling Yu
- Applicant Address: US CA San Jose
- Assignee: Altera Corporation
- Current Assignee: Altera Corporation
- Current Assignee Address: US CA San Jose
- Agent Steven J. Cahill
- Main IPC: H03K5/22
- IPC: H03K5/22

Abstract:
A circuit includes a comparator, a programmable current source, and a control circuit. The comparator is operable to compare an internal supply voltage of the circuit to a reference voltage. The programmable current source is operable to supply a first current for the reference voltage. The control circuit is operable to control the first current through the programmable current source based on an output signal of the comparator.
Public/Granted literature
- US20120229169A1 Techniques For Measuring Voltages in a Circuit Public/Granted day:2012-09-13
Information query
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