Invention Grant
- Patent Title: Particle counting method
- Patent Title (中): 粒子计数法
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Application No.: US13307318Application Date: 2011-11-30
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Publication No.: US08497989B2Publication Date: 2013-07-30
- Inventor: Takehiro Imai , Tomonobu Matsuda , Toshiyuki Abe , Tsutomu Nakajima
- Applicant: Takehiro Imai , Tomonobu Matsuda , Toshiyuki Abe , Tsutomu Nakajima
- Applicant Address: JP Tokyo
- Assignee: Rion Co., Ltd.
- Current Assignee: Rion Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Sheridan Ross P.C.
- Priority: JP2010-266699 20101130
- Main IPC: G01N21/49
- IPC: G01N21/49

Abstract:
A particle counting method that can count the number of the particles precisely. The method discriminates a wave pattern of the scattered light from a normal particle (subject of the counting) and a wave pattern of the light scattered by the agitation such as a floating particle, a radiation or changes in the intensity of the light. In one embodiment, a method for counting particles is disclosed which irradiates a light to a sample gas, detects a scattered light from a particle included in the sample gas by a photoelectric conversion device, counts the number of the particles of every particle size division by the output voltage wave pattern of the photoelectric conversion device, calculate a time difference (Ta−T1) from a point (T1) being a peak of output voltage wave pattern and a point (Ta) being a falling detection threshold (A), when the time difference (Ta−T1) is beyond counting cancellation time (B), the output voltage wave pattern is not counted as a particle.
Public/Granted literature
- US20120133936A1 PARTICLE COUNTING METHOD Public/Granted day:2012-05-31
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