Invention Grant
- Patent Title: Systems and methods for spiral waveform detection
- Patent Title (中): 用于螺旋波形检测的系统和方法
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Application No.: US12955821Application Date: 2010-11-29
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Publication No.: US08498072B2Publication Date: 2013-07-30
- Inventor: Viswanath Annampedu , Jeffrey P. Grundvig , Keith R. Bloss , Vishal Narielwala
- Applicant: Viswanath Annampedu , Jeffrey P. Grundvig , Keith R. Bloss , Vishal Narielwala
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Hamilton DeSanctis & Cha
- Main IPC: G11B5/09
- IPC: G11B5/09 ; G11B21/02

Abstract:
Various embodiments of the present invention provide systems and methods for determining a location of a spiral pattern. As an example, a location detection circuits is discussed that includes: a pattern detection circuit, a computation circuit, and a center determination circuit. The pattern detection circuit is operable to identify a subset of a series of data samples corresponding to a defined pattern, and to indicate a location of the identified subset of the series of data samples. The series of data samples corresponds to a spiral pattern. The computation circuit operable to sum an absolute value of each sample of the subset of the series of data samples to yield a sum. The center determination circuit operable to identify a location of the spiral pattern using the sum.
Public/Granted literature
- US20120134043A1 Systems and Methods for Spiral Waveform Detection Public/Granted day:2012-05-31
Information query
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