Invention Grant
- Patent Title: Method to control the emission of a beam of electrons in a cathode, corresponding cathode, tube and imaging system
- Patent Title (中): 控制阴极,相应阴极,管和成像系统中电子束发射的方法
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Application No.: US12829850Application Date: 2010-07-02
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Publication No.: US08498378B2Publication Date: 2013-07-30
- Inventor: Gwenael Lemarchand , Frederic Dahan , Christelle Gaudin
- Applicant: Gwenael Lemarchand , Frederic Dahan , Christelle Gaudin
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Global Patent Operation
- Priority: FR0954636 20090706
- Main IPC: H01J35/06
- IPC: H01J35/06 ; H01J35/14 ; H01J35/30

Abstract:
A method for controlling emission of a beam of electrons in an X-ray imaging tube. The X-ray imaging tube has an anode and a cathode. The method comprises a step in which at least one emission device included in the cathode emits an accelerated incident beam of electrons onto an impact focal spot on the anode to generate X-rays. An emission device is associated firstly with an assembly of polarizing plates and secondly with a focusing cup. An electric generator simultaneously applies a beam focusing voltage to the assembly and/or to the cup to control a characteristic dimension of the focal spot, and a cut-off voltage to the cup to control the emission of the beam by the device. The invention also concerns a corresponding cathode, tube and imaging system.
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