Invention Grant
- Patent Title: Optimized multi frequency PIM tester topology
- Patent Title (中): 优化多频PIM测试仪拓扑
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Application No.: US12869588Application Date: 2010-08-26
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Publication No.: US08498582B1Publication Date: 2013-07-30
- Inventor: Donald Anthony Bradley
- Applicant: Donald Anthony Bradley
- Applicant Address: US CA Morgan Hill
- Assignee: Anritsu Company
- Current Assignee: Anritsu Company
- Current Assignee Address: US CA Morgan Hill
- Main IPC: H04B17/00
- IPC: H04B17/00

Abstract:
In accordance with an embodiment, a system for measuring passive intermodulation (PIM), comprises a base unit, which includes frequency-independent components, and a frequency-dependent plugin, which includes frequency-dependent components and is associated with a particular frequency band. The frequency-dependent plugin can be combined with the base unit to measure PIM over the particular frequency band.
Information query