Invention Grant
- Patent Title: Methods and apparatuses for master-slave detection
- Patent Title (中): 主从检测方法和装置
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Application No.: US13209234Application Date: 2011-08-12
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Publication No.: US08499187B2Publication Date: 2013-07-30
- Inventor: Kang-Yong Kim , Jacob Robert Anderson , Huy Vo
- Applicant: Kang-Yong Kim , Jacob Robert Anderson , Huy Vo
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G06F1/14
- IPC: G06F1/14

Abstract:
Apparatuses, master-slave detect circuits, memories, and methods are disclosed. One such method includes performing a master detect phase during which a memory unit in a memory group is determined to be a master memory unit, determining at each memory unit its location relative to other memory units, and determining at each memory unit its location in the memory group based on a total number of slave memory units and its location relative to other memory units.
Public/Granted literature
- US20130042138A1 METHODS AND APPARATUSES FOR MASTER-SLAVE DETECTION Public/Granted day:2013-02-14
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