Invention Grant
- Patent Title: Critical path monitor for an integrated circuit and method of operation thereof
- Patent Title (中): 集成电路的关键路径监视器及其操作方法
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Application No.: US12247992Application Date: 2008-10-08
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Publication No.: US08499230B2Publication Date: 2013-07-30
- Inventor: Sreejit Chakravarty
- Applicant: Sreejit Chakravarty
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A path monitor, a method of monitoring a path, an integrated circuit and a library of standard logic elements. In one embodiment, the path monitor includes: (1) a delay element having an input couplable to an input of a clocked flip-flop associated with a path to be monitored and configured to provide a predetermined delay and (2) a clocked exclusive OR gate having a clock input, a first input coupled to an output of the delay element, a second input couplable to the output of the clocked flip-flop and an output at which the clocked exclusive OR gate is configured to respond to a clock signal to provide an error signal only when logic levels of the first input and the second input differ.
Public/Granted literature
- US20090278576A1 CRITICAL PATH MONITOR FOR AN INTEGRATED CIRCUIT AND METHOD OF OPERATION THEREOF Public/Granted day:2009-11-12
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