Invention Grant
US08499230B2 Critical path monitor for an integrated circuit and method of operation thereof 失效
集成电路的关键路径监视器及其操作方法

  • Patent Title: Critical path monitor for an integrated circuit and method of operation thereof
  • Patent Title (中): 集成电路的关键路径监视器及其操作方法
  • Application No.: US12247992
    Application Date: 2008-10-08
  • Publication No.: US08499230B2
    Publication Date: 2013-07-30
  • Inventor: Sreejit Chakravarty
  • Applicant: Sreejit Chakravarty
  • Applicant Address: US CA Milpitas
  • Assignee: LSI Corporation
  • Current Assignee: LSI Corporation
  • Current Assignee Address: US CA Milpitas
  • Main IPC: G06F11/00
  • IPC: G06F11/00
Critical path monitor for an integrated circuit and method of operation thereof
Abstract:
A path monitor, a method of monitoring a path, an integrated circuit and a library of standard logic elements. In one embodiment, the path monitor includes: (1) a delay element having an input couplable to an input of a clocked flip-flop associated with a path to be monitored and configured to provide a predetermined delay and (2) a clocked exclusive OR gate having a clock input, a first input coupled to an output of the delay element, a second input couplable to the output of the clocked flip-flop and an output at which the clocked exclusive OR gate is configured to respond to a clock signal to provide an error signal only when logic levels of the first input and the second input differ.
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