Invention Grant
- Patent Title: Radiation measurement instrument calibration facility capable of lowering scattered radiation and shielding background radiation
- Patent Title (中): 辐射测量仪器校准设备能够降低散射辐射和屏蔽背景辐射
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Application No.: US13278666Application Date: 2011-10-21
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Publication No.: US08502134B2Publication Date: 2013-08-06
- Inventor: Jeng-Hung Lee , Shi-Hwa Su , Bor-Jing Chang
- Applicant: Jeng-Hung Lee , Shi-Hwa Su , Bor-Jing Chang
- Applicant Address: TW Taoyuan County
- Assignee: Institute of Nuclear Energy Research Atomic Energy Council, Executive Yuan
- Current Assignee: Institute of Nuclear Energy Research Atomic Energy Council, Executive Yuan
- Current Assignee Address: TW Taoyuan County
- Agency: WPAT, PC
- Agent Justin King
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G21F5/00

Abstract:
The present invention relates to a radiation measurement instrument calibration facility with the abilities of lowering scattered radiation and shielding background radiation and it is capable of providing a suitable environment for performing performance test, calibration and experiment upon a radiation measurement instrument. In an embodiment, the calibration facility comprises: a shielding device, a collimator, a multi-source irradiator, a radiation baffle, a carrier, an electric door unit and a control unit. With the design of the calibration facility of the present invention, the interference coming from the background radiation and scattered radiation in the laboratory during the radiation measurement instrument calibration can be effectively reduced to enhance the accuracy of measurement or calibration for the instrument, and also the instrument calibration and testing can be performed in radiation fields of low-, medium- and high-dose rate levels to meet the requirements of ISO 4037-1 (1996) Standard.
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