Invention Grant
- Patent Title: Device for the exalted detection of the emission of a target particle
- Patent Title (中): 用于高级检测目标粒子发射的装置
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Application No.: US12515664Application Date: 2007-11-21
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Publication No.: US08502169B2Publication Date: 2013-08-06
- Inventor: Hervé Rigneault , Pierre-François Lenne , Jérôme Wenger , Evgueni Popov , Thomas Ebbesen
- Applicant: Hervé Rigneault , Pierre-François Lenne , Jérôme Wenger , Evgueni Popov , Thomas Ebbesen
- Applicant Address: FR Paris FR Marseilles
- Assignee: Centre National de la Recherche Scientifique-CNRS,Universite d'Aix-Marseille
- Current Assignee: Centre National de la Recherche Scientifique-CNRS,Universite d'Aix-Marseille
- Current Assignee Address: FR Paris FR Marseilles
- Agency: Arent Fox LLP
- Priority: FR0610178 20061121
- International Application: PCT/FR2007/001913 WO 20071121
- International Announcement: WO2008/074938 WO 20080626
- Main IPC: G01N21/64
- IPC: G01N21/64

Abstract:
The invention relates to a device (1) for detecting the emission of a target particle (6) at an emission wavelength, said device comprising: a photo-detector (2, 2A, 2B) comprising a sensitive detection surface having a high optical index; wherein said target particle (6) can be positioned in the vicinity of said sensitive surface in an analysis medium (13) having a low optical index; said device being characterized in that it further comprises: a mask (3) covering said sensitive surface, said mask including at least one area (4) opaque at said emission wavelength and at least one hole (5), said hole being capable of receiving the target particle; and in that the mask includes at least one interface; 7 said device further comprising at least one groove (10, 10A, 10B) provided at said interface, each of said at least one groove surrounding each of said at least one hole.
Public/Granted literature
- US20100140460A1 DEVICE FOR THE EXALTED DETECTION OF THE EMISSION OF A TARGET PARTICLE Public/Granted day:2010-06-10
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