Invention Grant
- Patent Title: Irradiation of at least two target volumes
- Patent Title (中): 至少照射两个目标体积
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Application No.: US13125941Application Date: 2009-10-17
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Publication No.: US08502177B2Publication Date: 2013-08-06
- Inventor: Christoph Bert , Eike Rietzel
- Applicant: Christoph Bert , Eike Rietzel
- Applicant Address: DE Darmstadt DE München
- Assignee: GSI Helmholtzzentrum für Schwerionenforschung GmbH,Siemens AG
- Current Assignee: GSI Helmholtzzentrum für Schwerionenforschung GmbH,Siemens AG
- Current Assignee Address: DE Darmstadt DE München
- Agency: Reising Ethington PC
- Priority: DE102008053321 20081027
- International Application: PCT/EP2009/007461 WO 20091017
- International Announcement: WO2010/049071 WO 20100506
- Main IPC: A61N5/10
- IPC: A61N5/10

Abstract:
The invention concerns an idea of planning irradiation of two target points (81, 9) with a beam approaching target points (72) for the purpose of depositing a first target dose distribution in a first of the two target volumes (81, 92) and a second target dose distribution in a second of the two target volumes (81, 92). The idea is characterized by the following steps:assigning target points (72) to one of the target volumes (81, 92), detecting an overlap of a first deposition caused by approaching a target point (72) assigned to the first target volume (81, 92) with a second deposition caused by approaching a target point (72) assigned to the second target volume (81, 92), and adapting the planning process for at least one of the target points (72) whose approach contributes to the overlap of the first and second deposition.
Public/Granted literature
- US20110272600A1 Irradiation of at Least Two Target Volumes Public/Granted day:2011-11-10
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