Invention Grant
US08502219B2 Method for growing zinc-oxide-based semiconductor device and method for manufacturing semiconductor light emitting device
有权
用于生长氧化锌基半导体器件的方法和用于制造半导体发光器件的方法
- Patent Title: Method for growing zinc-oxide-based semiconductor device and method for manufacturing semiconductor light emitting device
- Patent Title (中): 用于生长氧化锌基半导体器件的方法和用于制造半导体发光器件的方法
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Application No.: US12784732Application Date: 2010-05-21
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Publication No.: US08502219B2Publication Date: 2013-08-06
- Inventor: Naochika Horio , Masayuki Makishima
- Applicant: Naochika Horio , Masayuki Makishima
- Applicant Address: JP Tokyo
- Assignee: Stanley Electric Co., Ltd.
- Current Assignee: Stanley Electric Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz, Goodman & Chick, P.C.
- Priority: JP2009-125495 20090525
- Main IPC: H01L29/88
- IPC: H01L29/88

Abstract:
A method which has a low-temperature growth step of growing a buffer layer of a ZnO-based single crystal on the substrate at a growth temperature in the range of 250° C. to 450° C. using a polar oxygen material and a metalorganic compound containing no oxygen; performing a heat treatment of the buffer layer to effect a transition of the buffer layer to a thermostable-state single crystal layer; and a high-temperature growth step of growing the ZnO-based single crystal layer on the thermostable-state single crystal layer at a growth temperature in the range of 600° C. to 900° C. using a polar oxygen material and a metalorganic compound containing no oxygen.
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