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Invention Grant
US08502227B2 Active matrix substrate, display device, method for inspecting the active matrix substrate, and method for inspecting the display device 有权
有源矩阵基板，显示装置，有源矩阵基板的检查方法以及检查显示装置的方法

Active matrix substrate, display device, method for inspecting the active matrix substrate, and method for inspecting the display device
Abstract:
An active matrix substrate (2) is provided with first connecting wirings (641, 643, 645, 647) connected to gate terminals (51) to which extraction wirings (611, 613, 615, 617) are connected, second connecting wirings (642, 644, 646) connected to gate terminals (51) to which extraction wirings (612, 614, 616) are connected, bundled wirings (651 to 654) each composed of a mutually adjacent first connecting wiring and second connecting wiring bunched together, a first inspection wiring (66) capable of inputting an inspection signal to bunched wirings (652, 654) that are not adjacent to each other among the bundled wirings, and a second inspection wiring (67) capable of inputting an inspection signal to bundled wirings (651, 653) that are not adjacent to each other and not connected to the first inspection wiring (66) among the bundled wirings.
Abstract(Chinese):

有源矩阵基板（2）设置有连接到栅极端子（51）的第一连接布线（641,643,645,647），第一连接布线（641,643,645,647）连接到提取布线（611,613,615,617），第二连接布线 ，644,646），与栅极端子（51）连接，抽取布线（612,614,616）连接到所述栅极端子（51），每个由彼此相邻的第一连接布线和第二连接布线组合的捆扎布线（651至654） 第一检查布线（66），其能够对捆扎布线中彼此不相邻的聚束布线（652,654）输入检查信号;以及第二检查布线（67），其能够将检查信号输入到捆扎布线（ 651,653），它们彼此不相邻并且未连接到捆扎布线中的第一检查布线（66）。

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