Invention Grant
- Patent Title: Apparatus for optical inspection
- Patent Title (中): 光学检测仪器
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Application No.: US13051874Application Date: 2011-03-18
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Publication No.: US08502967B2Publication Date: 2013-08-06
- Inventor: Cooper S. K. Kuo , Ron Tsai , Steven Lee
- Applicant: Cooper S. K. Kuo , Ron Tsai , Steven Lee
- Applicant Address: TW New Taipai
- Assignee: Cooper S. K. Kuo
- Current Assignee: Cooper S. K. Kuo
- Current Assignee Address: TW New Taipai
- Agency: Hershkovitz & Associates PLLC
- Agent Abe Hershkovitz
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
An apparatus for optical inspection comprises a platform extending in a first direction, a transmitting unit for transporting at least one carrier in the first direction from an input port to an output port thereof, each of the at least one carrier to support one of at least one object to be inspected, a first detector disposed above the platform and extending in a second direction orthogonal to the first direction for inspecting the at least one object on the at least one carrier, the first detector including a first scanner extending in the second direction between the input port and the output port, and a first roller set between the first scanner and the input port to apply force onto a surface of each of the at least one object.
Public/Granted literature
- US20120194806A1 APPARATUS FOR OPTICAL INSPECTION Public/Granted day:2012-08-02
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