Invention Grant
- Patent Title: Apparatus for the detection of light in a scanning microscope
- Patent Title (中): 用于在扫描显微镜中检测光的装置
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Application No.: US12600646Application Date: 2008-05-06
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Publication No.: US08503076B2Publication Date: 2013-08-06
- Inventor: Holger Birk , Volker Seyfried
- Applicant: Holger Birk , Volker Seyfried
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Agency: Schlee IP International, P.C.
- Agent Alexander R. Schlee
- Priority: DE102007024074 20070522
- International Application: PCT/EP2008/055537 WO 20080506
- International Announcement: WO2008/141919 WO 20081127
- Main IPC: G02B21/00
- IPC: G02B21/00

Abstract:
A light detector for use in a line scanning microscope and a microscope comprising such a light detector are described. The light detector comprises a line array of avalanche semiconductor detectors; and an electronic trigger circuit that is adapted to operate the avalanche semiconductor detectors in at least one of a Geiger mode with internal charge amplification and in a linear mode. The trigger circuit further comprises a parallel counter that is designed to read out in parallel light pulses detected by the avalanche semiconductor detectors. The parallel counter is adapted to accumulate the light pulses detected by the avalanche semiconductor detectors over a preset counting time.
Public/Granted literature
- US20100214654A1 APPARATUS FOR THE DETECTION OF LIGHT IN A SCANNING MICROSCOPE Public/Granted day:2010-08-26
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