Invention Grant
- Patent Title: Fault protected current source for lighting element testing
- Patent Title (中): 用于照明元件测试的故障保护电流源
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Application No.: US13086313Application Date: 2011-04-13
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Publication No.: US08503145B2Publication Date: 2013-08-06
- Inventor: Jeffery Neil Hulett
- Applicant: Jeffery Neil Hulett
- Applicant Address: US CA San Diego
- Assignee: Vektrek Electronic Systems, Inc.
- Current Assignee: Vektrek Electronic Systems, Inc.
- Current Assignee Address: US CA San Diego
- Agency: Sheppard Mullin Richter & Hampton LLP
- Main IPC: H02H9/02
- IPC: H02H9/02 ; G05F1/573 ; G05F1/00 ; H05B37/02
Abstract:
A fault protected current source is provided that can be used to safely drive LEDs in reliability test systems. The current source is includes circuits and processes that detect the common faults found in LED reliability test systems. After a fault is detected, the current source shuts down drive before destructive spikes are produced. Because only true LED failures are counted, this fault protected current source can be used to construct reliability test systems that produce more accurate reliability test data.
Public/Granted literature
- US20110254530A1 FAULT PROTECTED CURRENT SOURCE FOR LIGHTING ELEMENT TESTING Public/Granted day:2011-10-20
Information query
