Invention Grant
US08503236B2 Nonvolatile memory device, methods of programming the nonvolatile memory device and memory system including the nonvolatile memory device 有权
非易失性存储器件,非易失性存储器件的编程方法和包括非易失性存储器件的存储器系统

  • Patent Title: Nonvolatile memory device, methods of programming the nonvolatile memory device and memory system including the nonvolatile memory device
  • Patent Title (中): 非易失性存储器件,非易失性存储器件的编程方法和包括非易失性存储器件的存储器系统
  • Application No.: US13038220
    Application Date: 2011-03-01
  • Publication No.: US08503236B2
    Publication Date: 2013-08-06
  • Inventor: Jeong-Woo Lee
  • Applicant: Jeong-Woo Lee
  • Applicant Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
  • Assignee: Samsung Electronics Co., Ltd.
  • Current Assignee: Samsung Electronics Co., Ltd.
  • Current Assignee Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
  • Agency: Muir Patent Consulting, PLLC
  • Priority: KR10-2010-0018670 20100302
  • Main IPC: G11C11/34
  • IPC: G11C11/34
Nonvolatile memory device, methods of programming the nonvolatile memory device and memory system including the nonvolatile memory device
Abstract:
Embodiments of the inventive concept provide a nonvolatile memory device. The nonvolatile memory device includes a memory cell array, a read/write circuit, and a backup circuit. The memory cell array includes a first memory block including a first word line having first memory cells and a second word line having second memory cells. Each of the first memory cells and second memory cells configured to store first-bit data and second-bit data. The read/write circuit is configured to program data into the first and second memory cells and read data stored in the first and second memory cells. The backup circuit is configured to, after first-bit data are programmed into the first word line, but before second-bit data are programmed into the first word line, store first-bit data stored in the second memory cells of the second word line.
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