Invention Grant
- Patent Title: Time delay measurement
- Patent Title (中): 延时测量
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Application No.: US12531773Application Date: 2008-03-27
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Publication No.: US08503578B2Publication Date: 2013-08-06
- Inventor: Nongji Chen
- Applicant: Nongji Chen
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: GB0706311.8 20070330
- International Application: PCT/GB2008/001119 WO 20080327
- International Announcement: WO2008/119972 WO 20081009
- Main IPC: H04L27/06
- IPC: H04L27/06

Abstract:
A method of processing first and second corresponding signals having a delay therebetween. The method includes introducing a plurality of different delays between the first and second signals, successive delay amounts differing from each other by less than the interval between chip boundaries, and for each introduced delay, summing samples of the second signal which are obtained at the times of, at least, chip boundaries between bits of the first signal which have the same state, to obtain a value; thereby to obtain a representation of how the value varies according to the introduced delay, which representation contains a level change associated with an introduced delay which bears a predetermined relationship to the delay between the first and second signals.
Public/Granted literature
- US20100104048A1 TIME DELAY MEASUREMENT Public/Granted day:2010-04-29
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