Invention Grant
US08503578B2 Time delay measurement 有权
延时测量

Time delay measurement
Abstract:
A method of processing first and second corresponding signals having a delay therebetween. The method includes introducing a plurality of different delays between the first and second signals, successive delay amounts differing from each other by less than the interval between chip boundaries, and for each introduced delay, summing samples of the second signal which are obtained at the times of, at least, chip boundaries between bits of the first signal which have the same state, to obtain a value; thereby to obtain a representation of how the value varies according to the introduced delay, which representation contains a level change associated with an introduced delay which bears a predetermined relationship to the delay between the first and second signals.
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