Invention Grant
- Patent Title: Detecting method and detecting apparatus
- Patent Title (中): 检测方法和检测装置
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Application No.: US12909784Application Date: 2010-10-21
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Publication No.: US08504327B2Publication Date: 2013-08-06
- Inventor: Hideaki Yamada , Michihiro Nagaishi
- Applicant: Hideaki Yamada , Michihiro Nagaishi
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Kilpatrick Townsend & Stockton LLP
- Priority: JP2009-244203 20091023
- Main IPC: G01D1/00
- IPC: G01D1/00 ; G01D21/00 ; G06F17/40 ; G06F19/00
Abstract:
A detecting method employing a first sensor and a second sensor, includes: first processing for detecting, on the basis of an output value of the first sensor, a predetermined state defined in advance; second processing for starting the second sensor according to the detection of the predetermined state; and third processing for generating interpolation data from an output value of the first sensor in a predetermined time until the second sensor becomes capable of outputting a measurement value after being started.
Public/Granted literature
- US20110098979A1 DETECTING METHOD AND DETECTING APPARATUS Public/Granted day:2011-04-28
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