Invention Grant
US08504896B2 Method of operating nonvolatile memory device and nonvolatile memory device for implementing the same
失效
操作非易失性存储器件的方法和用于实现其的非易失性存储器件
- Patent Title: Method of operating nonvolatile memory device and nonvolatile memory device for implementing the same
- Patent Title (中): 操作非易失性存储器件的方法和用于实现其的非易失性存储器件
-
Application No.: US12774658Application Date: 2010-05-05
-
Publication No.: US08504896B2Publication Date: 2013-08-06
- Inventor: Sang Kyu Lee , Seung Jae Chung
- Applicant: Sang Kyu Lee , Seung Jae Chung
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2009-0059147 20090630
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
A method of operating a nonvolatile memory device including a memory cell array having first and second main cells for storing external input data, first spare cells for storing data for error correction code (ECC) processing on the data stored in the first and second main cells and second spare cells for storing data for ECC processing on the data stored in the first and second main cells which involves reading the data stored in the first spare cells, reading the data stored in the second main cells and the data stored in the second spare cells, and performing the ECC processing on the data read from the second main cells using the data read from the first spare cells and the data read from the second spare cells.
Public/Granted literature
- US20100332946A1 METHOD OF OPERATING NONVOLATILE MEMORY DEVICE AND NONVOLATILE MEMORY DEVICE FOR IMPLEMENTING THE SAME Public/Granted day:2010-12-30
Information query