Invention Grant
US08505109B2 Measuring probe device for a probe microscope, measuring cell and scanning probe microscope
有权
用于探针显微镜,测量单元和扫描探针显微镜的测量探针装置
- Patent Title: Measuring probe device for a probe microscope, measuring cell and scanning probe microscope
- Patent Title (中): 用于探针显微镜,测量单元和扫描探针显微镜的测量探针装置
-
Application No.: US12670561Application Date: 2008-07-24
-
Publication No.: US08505109B2Publication Date: 2013-08-06
- Inventor: Torsten Jähnke , Torsten Müller , Kathryn Anne Poole , Detlef Knebel
- Applicant: Torsten Jähnke , Torsten Müller , Kathryn Anne Poole , Detlef Knebel
- Applicant Address: DE Berlin
- Assignee: JPK Instruments AG
- Current Assignee: JPK Instruments AG
- Current Assignee Address: DE Berlin
- Agency: Smith Patent Office
- Priority: DE102007034853 20070724
- International Application: PCT/DE2008/001202 WO 20080724
- International Announcement: WO2009/012765 WO 20090129
- Main IPC: G01Q30/14
- IPC: G01Q30/14

Abstract:
The invention relates to a measuring probe device for a probe microscope, in particular a scanning probe microscope, with a measuring probe holder and a measuring probe arranged on the measuring probe holder, which is set up for a probe microscopic investigation of a sample, wherein on the measuring probe holder, a measuring probe chamber is formed, which receives the measuring probe at least partially and is open on a side away from the measuring probe holder, and is configured to receive a liquid surrounding the measuring probe. The invention also relates to a measuring cell for receiving a liquid sample for a probe microscope, a scanning probe microscope with a measuring probe device and a scanning probe microscope with a measuring cell.
Public/Granted literature
- US20100263096A1 MEASURING PROBE DEVICE FOR A PROBE MICROSCOPE, MEASURING CELL AND SCANNING PROBE MICROSCOPE Public/Granted day:2010-10-14
Information query