Invention Grant
- Patent Title: Device for receiving a test sample
- Patent Title (中): 用于接收测试样本的设备
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Application No.: US11659374Application Date: 2005-08-04
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Publication No.: US08506909B2Publication Date: 2013-08-13
- Inventor: Olaf Sünwoldt , Detlef Knebel
- Applicant: Olaf Sünwoldt , Detlef Knebel
- Applicant Address: DE Berlin
- Assignee: JPK Instruments AG
- Current Assignee: JPK Instruments AG
- Current Assignee Address: DE Berlin
- Agency: Smith Patent Office
- Priority: DE202004012394U 20040805
- International Application: PCT/DE2005/001395 WO 20050804
- International Announcement: WO2006/012893 WO 20060209
- Main IPC: G01N21/03
- IPC: G01N21/03 ; G01N21/35

Abstract:
The invention relates to a device for receiving a test sample, particularly sample holders for combined examination of the test sample by a test procedure combined with another test procedure, which differs from the first test procedure, with a planar preparation component (1) in a transparent material with a preparation surface on which the test sample can be prepared, wherein a test path for the introduction of a test facility for carrying out the test procedure is formed on one side of the preparation component (1) and another test path for the introduction of a test facility for carrying out the other test procedure on the test sample is formed on an opposite side of the preparation component (1), wherein a supporting and covering element (3a) which has an aperture (5) through which the test path is formed is pressed against the preparation component (1) on one side (FIG. 1).
Public/Granted literature
- US20080163702A1 Device for Receiving a Test Sample Public/Granted day:2008-07-10
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