Invention Grant
- Patent Title: Semiconductor integrated device and operation method thereof
- Patent Title (中): 半导体集成器件及其操作方法
-
Application No.: US13345152Application Date: 2012-01-06
-
Publication No.: US08508394B2Publication Date: 2013-08-13
- Inventor: Toshiyuki Ishioka , Takuji Aso
- Applicant: Toshiyuki Ishioka , Takuji Aso
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Mattingly & Malur, PC
- Priority: JP2011-002829 20110111
- Main IPC: H03M1/00
- IPC: H03M1/00

Abstract:
In a semiconductor integrated circuit, having a central processing unit, a clock generating unit, an A/D converter and a sample and hold signal generating circuit, noise from an element that operates in accordance with operation timing that is difficult to predict beforehand is reduced. In a calibration operation, in response to a clock signal from the clock generating unit, a sample and hold signal generating circuit supplies a plurality of clock signals sequentially to a sample and hold circuit of the A/D converter. By analyzing a plurality of digital signals that are sequentially output from an A/D conversion circuit of the A/D converter, a timing of a holding period for allowing A/D conversion under a low noise condition is selected from the clock signals. In normal operation, a clock signal selected by the calibration operation is supplied as a sample and hold control signal to the sample and hold circuit.
Public/Granted literature
- US20120176261A1 SEMICONDUCTOR INTEGRATED DEVICE AND OPERATION METHOD THEREOF Public/Granted day:2012-07-12
Information query