Invention Grant
- Patent Title: Gas concentration measurement device
- Patent Title (中): 气体浓度测量装置
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Application No.: US13189303Application Date: 2011-07-22
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Publication No.: US08508739B2Publication Date: 2013-08-13
- Inventor: Yousuke Hoshino , Kenji Takubo , Naoji Moriya
- Applicant: Yousuke Hoshino , Kenji Takubo , Naoji Moriya
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Bingham McCutchen LLP
- Priority: JP2010-164767 20100722
- Main IPC: G01N21/59
- IPC: G01N21/59

Abstract:
A gas concentration measurement device which utilizes a TDLAS measurement method, and in which the phase-sensitive detection can be performed by digital processing using an integer-arithmetic device, is provided. In the gas concentration measurement device according to the present invention, AC components corresponding to integer multiples of a modulation frequency f contained in an input signal are removed by taking a moving average of data obtained from an output signal of a multiplier 62 for a period of time corresponding to one cycle of the modulation frequency f . As a result, a DC component in the output signal of a digital filter 63 relatively increases, making it easier to extract the DC component by a digital low-pass filter 64, so that a sufficiently accurate phase-sensitive detection can be made even if a digital processing based on integer arithmetic is used.
Public/Granted literature
- US20120188549A1 Gas Concentration Measurement Device Public/Granted day:2012-07-26
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