Invention Grant
- Patent Title: Interferometric systems having reflective chambers and related methods
- Patent Title (中): 具有反射室的干涉仪和相关方法
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Application No.: US13072294Application Date: 2011-03-25
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Publication No.: US08508746B2Publication Date: 2013-08-13
- Inventor: Adam Wax , Yizheng Zhu , Natan Tzvi Shaked
- Applicant: Adam Wax , Yizheng Zhu , Natan Tzvi Shaked
- Applicant Address: US NC Durham
- Assignee: Duke University
- Current Assignee: Duke University
- Current Assignee Address: US NC Durham
- Agency: Olive Law Group, PLLC
- Main IPC: G01B9/021
- IPC: G01B9/021

Abstract:
Disclosed herein are interferometric systems having reflective chambers and related methods. According to an aspect, an interferometric system may include a light source for generating an illumination beam that propagates towards a sample. A sample holder may hold the sample and include a partially reflective cover for allowing a first portion of the illumination beam to pass therethrough to interact with the sample to produce a sample beam that propagates substantially along an optical axis. The cover may be oriented at an angle for reflecting a second portion of the illumination beam to produce a reference beam that propagates at a predetermined angle with respect to the optical axis. An imaging module may redirect the reference beam towards the optical axis at a detection plane. A detector may intercept the sample and reference beams and may generate a holographic representation of the sample based on the beams.
Public/Granted literature
- US20110242543A1 INTERFEROMETRIC SYSTEMS HAVING REFLECTIVE CHAMBERS AND RELATED METHODS Public/Granted day:2011-10-06
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