Invention Grant
- Patent Title: Nonvolatile memory element and nonvolatile memory device
- Patent Title (中): 非易失性存储器元件和非易失性存储器件
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Application No.: US12994910Application Date: 2010-04-23
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Publication No.: US08508976B2Publication Date: 2013-08-13
- Inventor: Koji Katayama , Takeshi Takagi
- Applicant: Koji Katayama , Takeshi Takagi
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2009-111517 20090430
- International Application: PCT/JP2010/002943 WO 20100423
- International Announcement: WO2010/125780 WO 20101104
- Main IPC: G11C11/00
- IPC: G11C11/00 ; H01L45/00

Abstract:
Provided is a nonvolatile memory element which has a small variation in operation and allow stable operation. The nonvolatile memory element includes: a first electrode (102); a second electrode (106); a variable resistance layer (105) which is formed between the electrodes (102 and 106) and is connected to the electrodes (102 and 106), and which reversibly changes between a high resistance state and a low resistance state according to a polarity of a voltage applied between the electrodes (102 and 106); and a fixed resistance layer (104) which has a resistance value that is 0.1 and 10 times as large as a resistance value of the variable resistance layer in the high resistance state, the fixed resistance layer (104) being formed between the electrodes (102 and 106) and being electrically connected to at least a part of the variable resistance layer (105).
Public/Granted literature
- US20110103131A1 NONVOLATILE MEMORY ELEMENT AND NONVOLATILE MEMORY DEVICE Public/Granted day:2011-05-05
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