Invention Grant
- Patent Title: Spectrum analyzer and spectrum analysis method
- Patent Title (中): 频谱分析仪和频谱分析方法
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Application No.: US12967353Application Date: 2010-12-14
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Publication No.: US08509296B2Publication Date: 2013-08-13
- Inventor: Momoko Inadomaru , Toru Otani , Yuji Kishi
- Applicant: Momoko Inadomaru , Toru Otani , Yuji Kishi
- Applicant Address: JP Atsugi-Shi
- Assignee: Anritsu Corporation
- Current Assignee: Anritsu Corporation
- Current Assignee Address: JP Atsugi-Shi
- Agency: Pearne & Gordon LLP
- Priority: JP2009-286836 20091217
- Main IPC: H04B17/00
- IPC: H04B17/00 ; G01R23/16

Abstract:
There is provided a spectrum analyzer and a spectrum analysis method capable of promptly performing measurement while preventing the spectrum waveform caused by the fractional spurious components from being displayed.When the width of a designated span (analysis target frequency range) is larger than a boundary value, a reference signal frequency is set to a predetermined reference value, and a loop filter band narrower than a RBW (resolution bandwidth) is selected to thereby make the fractional spurious components be within the RBW and prevent it from being displayed as a spectrum waveform. Further, when the width of the designated span is smaller than a boundary value, the reference signal frequency is shifted from the reference value by a predetermined value so as to increase the frequency differences between the fractional spurious components and the main signal component of a VCO output signal by an amount equal to the product between the shift amount and the integer part of the frequency division ratio, and the band of the loop filter is set in accordance with the region including the RBW in a range narrower than the increased frequency difference so as to suppress the levels of the fractional spurious components.
Public/Granted literature
- US20110150062A1 SPECTRUM ANALYZER AND SPECTRUM ANALYSIS METHOD Public/Granted day:2011-06-23
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