Invention Grant
US08509487B2 System and method for optically measuring a parameter of an object
有权
用于光学测量物体的参数的系统和方法
- Patent Title: System and method for optically measuring a parameter of an object
- Patent Title (中): 用于光学测量物体的参数的系统和方法
-
Application No.: US11737234Application Date: 2007-04-19
-
Publication No.: US08509487B2Publication Date: 2013-08-13
- Inventor: Teng Hun Lim , Kuldeep Kumar Saxena , Meng Whui Tan
- Applicant: Teng Hun Lim , Kuldeep Kumar Saxena , Meng Whui Tan
- Applicant Address: SG Singapore
- Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee Address: SG Singapore
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A system and method for optically measuring a parameter of an object uses a first segment of the object captured as a first frame of image data using a first imaging region of an image sensor array and a second segment of the object as a second frame of image data using a second imaging region of the image sensor array, which is larger than the first imaging region, to determine a displaced distance of the object relative to the image sensor array.
Public/Granted literature
- US20080260262A1 SYSTEM AND METHOD FOR OPTICALLY MEASURING A PARAMETER OF AN OBJECT Public/Granted day:2008-10-23
Information query