Invention Grant
US08509885B2 S and M for analyzing and assessing depression and other mood disorders using electoencephalograhic (EEG) measurements
失效
S和M用于分析和评估使用电脑成像（EEG）测量的抑郁症和其他情绪障碍
- Patent Title: S and M for analyzing and assessing depression and other mood disorders using electoencephalograhic (EEG) measurements
- Patent Title (中): S和M用于分析和评估使用电脑成像（EEG）测量的抑郁症和其他情绪障碍
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Application No.: US13627382Application Date: 2012-09-26
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Publication No.: US08509885B2Publication Date: 2013-08-13
- Inventor: Steven M. Snyder , James D. Falk
- Applicant: NEBA Health, LLC
- Applicant Address: US GA Augusta
- Assignee: Neba Health LLC
- Current Assignee: Neba Health LLC
- Current Assignee Address: US GA Augusta
- Agency: Duft Bornsen & Fettig LLP
- Main IPC: A61B5/0476
- IPC: A61B5/0476
Abstract:
This invention is directed to systems and methods for analyzing depression, and more particularly relates to systems and methods for analyzing and assessing depression and mood disorders in an individual using electroencephalographic measurements. Embodiments of the invention are not limited to depression, but can also include other mood disorders such as bipolar disorder and other disorders with at least one genetic-related component.
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