Invention Grant
- Patent Title: External system for robotic accuracy enhancement
- Patent Title (中): 用于机器人精度提高的外部系统
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Application No.: US12408958Application Date: 2009-03-23
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Publication No.: US08509949B2Publication Date: 2013-08-13
- Inventor: Brett Alan Bordyn , Myles Daniel Markey , Michael John Kleeman
- Applicant: Brett Alan Bordyn , Myles Daniel Markey , Michael John Kleeman
- Applicant Address: US MI Plymouth
- Assignee: Variation Reduction Solutions, Inc.
- Current Assignee: Variation Reduction Solutions, Inc.
- Current Assignee Address: US MI Plymouth
- Agency: Inventa Capitol PLC
- Main IPC: G05B19/04
- IPC: G05B19/04 ; G05B19/18 ; G05B15/00 ; G05B19/00

Abstract:
The inventive concept of the metrology system (the system) actively determines the 6 Degree of Freedom (6-DOF) pose of a motion device such as, but not limited to, an industrial robot employing an end of arm tool (EOAT). A concept of the system includes using laser pointing devices without any inherent ranging capability in conjunction with the EOAT-mounted targets to actively determine the pose of the EOAT at distinct work positions of at least one motion device.
Public/Granted literature
- US20090240372A1 EXTERNAL SYSTEM FOR ROBOTIC ACCURACY ENHANCEMENT Public/Granted day:2009-09-24
Information query
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