Invention Grant
US08510059B2 Method and system for measuring emission and quantifying emission source
有权
用于测量排放和量化排放源的方法和系统
- Patent Title: Method and system for measuring emission and quantifying emission source
- Patent Title (中): 用于测量排放和量化排放源的方法和系统
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Application No.: US12759857Application Date: 2010-04-14
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Publication No.: US08510059B2Publication Date: 2013-08-13
- Inventor: Dennis Scott Prince
- Applicant: Dennis Scott Prince
- Applicant Address: CA Edmonton
- Assignee: Airdar Inc.
- Current Assignee: Airdar Inc.
- Current Assignee Address: CA Edmonton
- Agency: Bennett Jones LLP
- Main IPC: G01W1/00
- IPC: G01W1/00 ; G01P5/00

Abstract:
A system and method for quantifying an emission source is provided. The system and method obtain a plurality of emission concentration measurements at one or more sampling points and wind data over the time the emission concentrations are measured. For each sampling point, a virtual sampling arc can be constructed using the emission concentration measurements taken at the sampling point, the wind data for when the emission concentration measurement were taken and an approximate distance to the emission source. The virtual sampling arcs can then be used to construct one or more virtual sampling grids and the amount of emissions emanating from the emissions source approximated from the virtual sampling grids.
Public/Granted literature
- US20100268480A1 METHOD AND SYSTEM FOR MEASURING EMISSION AND QUANTIFYING EMISSION SOURCE Public/Granted day:2010-10-21
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