Invention Grant
- Patent Title: Bad block identification methods
- Patent Title (中): 坏块识别方法
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Application No.: US12487773Application Date: 2009-06-19
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Publication No.: US08510614B2Publication Date: 2013-08-13
- Inventor: Meng-Chang Liu , Pin-Chou Liu
- Applicant: Meng-Chang Liu , Pin-Chou Liu
- Applicant Address: TW Hsin-Chu
- Assignee: Mediatek Inc.
- Current Assignee: Mediatek Inc.
- Current Assignee Address: TW Hsin-Chu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
A bad block identification method for a memory is provided. The memory includes at least one memory block for storing data. A data decoding function is performed on the data, and it is determined whether the data decoding function was performed successfully. If the data decoding function was not performed successfully, at least one predetermined location in the memory block is checked. It is determined whether the predetermined location is marked by predetermined information. If the predetermined location is not marked by the predetermined information, the memory block is identified as a bad block.
Public/Granted literature
- US20100064187A1 BAD BLOCK IDENTIFICATION METHODS Public/Granted day:2010-03-11
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