Invention Grant
US08510692B2 Verification system and method using constrained random test parameter selection
有权
使用约束随机测试参数选择的验证系统和方法
- Patent Title: Verification system and method using constrained random test parameter selection
- Patent Title (中): 使用约束随机测试参数选择的验证系统和方法
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Application No.: US13248150Application Date: 2011-09-29
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Publication No.: US08510692B2Publication Date: 2013-08-13
- Inventor: Zachary Nathan Fister
- Applicant: Zachary Nathan Fister
- Applicant Address: US KY Lexington
- Assignee: Lexmark International, Inc.
- Current Assignee: Lexmark International, Inc.
- Current Assignee Address: US KY Lexington
- Main IPC: G06F9/455
- IPC: G06F9/455 ; G06F17/50

Abstract:
A software program for verifying a system design having at least one integrated circuit chip. The software program, when executed by a processor, result in obtaining a random value for a variable; selecting an unused value for the variable based upon the random value, the variable not having been assigned the unused value during one or more prior verification tests; and creating a new verification test for the system using the unused value for the variable. In this way, the new verification test is created in which variables falling within a random class are more efficiently used.
Public/Granted literature
- US20130086538A1 Design Verification System and Method Using Constrained Random Test Parameter Selection Public/Granted day:2013-04-04
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