Invention Grant
US08510692B2 Verification system and method using constrained random test parameter selection 有权
使用约束随机测试参数选择的验证系统和方法

Verification system and method using constrained random test parameter selection
Abstract:
A software program for verifying a system design having at least one integrated circuit chip. The software program, when executed by a processor, result in obtaining a random value for a variable; selecting an unused value for the variable based upon the random value, the variable not having been assigned the unused value during one or more prior verification tests; and creating a new verification test for the system using the unused value for the variable. In this way, the new verification test is created in which variables falling within a random class are more efficiently used.
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