Invention Grant
US08515706B2 Method for controlling driving of test device and analytic device for performing the same
有权
用于控制测试装置的驱动和执行该测试装置的分析装置的方法
- Patent Title: Method for controlling driving of test device and analytic device for performing the same
- Patent Title (中): 用于控制测试装置的驱动和执行该测试装置的分析装置的方法
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Application No.: US12858123Application Date: 2010-08-17
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Publication No.: US08515706B2Publication Date: 2013-08-20
- Inventor: Jong Rip Lee , Hyug Rae Cho , Seok Ho Kim , Sung Hwa Lee
- Applicant: Jong Rip Lee , Hyug Rae Cho , Seok Ho Kim , Sung Hwa Lee
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLC
- Priority: KR10-2009-0077056 20090820
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G06F11/00 ; G05B11/00

Abstract:
A method and apparatus for controlling driving of a test device that analyzes a sample are provided. The method includes identifying a test device, executing a script containing a plurality of operations to be performed to analyze the sample contained in the test device, wherein the script includes a plurality of operation commands, wherein at least one operation command among the plurality of operation commands includes a conditional statement, and wherein at least one operation command among the plurality of operation commands is designated to be executed according to whether the conditional statement is satisfied.
Public/Granted literature
- US20110046750A1 METHOD FOR CONTROLLING DRIVING OF TEST DEVICE AND ANALYTIC DEVICE FOR PERFORMING THE SAME Public/Granted day:2011-02-24
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