Invention Grant
- Patent Title: Opener and buffer table for test handler
- Patent Title (中): 打开器和缓冲表用于测试处理程序
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Application No.: US12666124Application Date: 2008-07-02
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Publication No.: US08523158B2Publication Date: 2013-09-03
- Inventor: Yun-Sung Na , In-Gu Jeon , Seung-Chul Ahn , Dong-Han Kim , Jae-Hyun Son
- Applicant: Yun-Sung Na , In-Gu Jeon , Seung-Chul Ahn , Dong-Han Kim , Jae-Hyun Son
- Applicant Address: KR Hwaseong-Si
- Assignee: TechWing., Co. Ltd.
- Current Assignee: TechWing., Co. Ltd.
- Current Assignee Address: KR Hwaseong-Si
- Agency: Jefferson IP Law, LLP
- Priority: KR10-2007-0071366 20070716
- International Application: PCT/KR2008/003888 WO 20080702
- International Announcement: WO2009/011508 WO 20090122
- Main IPC: B23Q1/64
- IPC: B23Q1/64 ; B23Q3/00 ; B23Q3/02 ; B25B1/22 ; B25B1/00 ; B25B11/00 ; G01R31/00 ; H01R13/648

Abstract:
An opener and a buffer table for a test handler are disclosed. The opener includes an opening plate, a plurality of pin blocks forming pairs, and at least one or more interval retaining apparatus for retaining an interval between the pin blocks forming a pair. Each of the pin blocks is movably coupled to the opening plate, and includes opening pins for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board. Although semiconductor devices to be tested are altered in size and a carrier board loading with the semiconductor devices is thus replaced, the opener does not need to be replaced, thereby reducing the replacement cost and the waste of resources.
Public/Granted literature
- US20100320348A1 OPENER AND BUFFER TABLE FOR TEST HANDLER Public/Granted day:2010-12-23
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