Invention Grant
- Patent Title: Quality control system
- Patent Title (中): 质量控制体系
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Application No.: US11710424Application Date: 2007-02-26
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Publication No.: US08524153B2Publication Date: 2013-09-03
- Inventor: Tomonori Mimura , Kazumitsu Kawase
- Applicant: Tomonori Mimura , Kazumitsu Kawase
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2006-068481 20060314
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
In a clinical laboratory of a hospital, an enormous amount of effort has been required to maintain the quality of an analyzer, standard solution and control samples. An object of the present invention is to provide a control method for controlling a clinical laboratory with reduced cost, and a control apparatus using the same.In order to control data of an analyzer, standard solution, and a control sample, a support center is connected to each analyzer located in each hospital through a network line. Various kinds of analysis parameters and the result of measurements are exchanged so as to provide each clinical laboratory with a control situation in real time.
Public/Granted literature
- US20070217949A1 Quality control system Public/Granted day:2007-09-20
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