Invention Grant
- Patent Title: Method of manufacturing gas barrier film
- Patent Title (中): 阻气膜的制造方法
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Application No.: US13044024Application Date: 2011-03-09
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Publication No.: US08524333B2Publication Date: 2013-09-03
- Inventor: Tatsuya Fujinami
- Applicant: Tatsuya Fujinami
- Applicant Address: JP Tokyo
- Assignee: Fujifilm Corporation
- Current Assignee: Fujifilm Corporation
- Current Assignee Address: JP Tokyo
- Agency: Young & Thompson
- Priority: JP2010-051346 20100309
- Main IPC: C23C16/34
- IPC: C23C16/34 ; C23C16/52

Abstract:
The method of manufacturing a gas barrier film feeds long lengths of a substrate and forms a silicon nitride film as the gas barrier film on the substrate by a capacitively coupled plasma-enhanced CVD technique while transporting the substrate in a longitudinal direction. Gaseous raw materials using in the forming step of the silicon nitride film includes at least silane gas and ammonia gas, and a ratio P/Q [W/sccm] is not less than 1 when a flow rate of the silane gas is denoted as Q [sccm] and a power input for generating a capacitively coupled plasma is denoted as P [W], a tension applied to the substrate transported between two transporting elements is not more than 100 [N/m], and a pair of electrodes for at least forming the silicon nitride film on the substrate is interposed between the two transporting elements.
Public/Granted literature
- US20110223358A1 METHOD OF MANUFACTURING GAS BARRIER FILM Public/Granted day:2011-09-15
Information query
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