Invention Grant
- Patent Title: Low cost simplified spectrum analyzer for magnetic head/media tester
-
Application No.: US11999169Application Date: 2007-12-04
-
Publication No.: US08525509B2Publication Date: 2013-09-03
- Inventor: Lou Shrinkle , Peter Crill , Matthew Yee , David Hu
- Applicant: Lou Shrinkle , Peter Crill , Matthew Yee , David Hu
- Applicant Address: US CA Milpitas
- Assignee: Headway Technologies, Inc.
- Current Assignee: Headway Technologies, Inc.
- Current Assignee Address: US CA Milpitas
- Agency: Saile Ackerman LLC
- Agent Stephen B. Ackerman
- Main IPC: G01R23/00
- IPC: G01R23/00

Abstract:
An electronic component tester characterizes electronic components such as magnetic head/media components measure performance parameters such as signal-to-noise ratio and overwrite evaluation. The electronic component tester has a tester process controller and a spectrum analyzer. The tester process controller generates calibration and control signals for the electronic component tester. The spectrum analyzer is in communication with electronic components such as magnetic head or media components to receive a response characterization signal resulting from a stimulus signal applied to the electronic components. The spectrum analyzer then determines a frequency spectrum of the response characterization signal. The spectrum analyzer is also in communication with the tester process controller for transferring the frequency spectrum to the tester process controller. The spectrum analyzer receives the calibration and control signals from the tester process controller for removing effects of an image frequency of the frequency spectrum and determining noise bandwidth of the frequency spectrum.
Public/Granted literature
- US20090140732A1 Low cost simplified spectrum analyzer for magnetic head/media tester Public/Granted day:2009-06-04
Information query