Invention Grant
- Patent Title: Detector circuit and semiconductor device using same
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Application No.: US12941134Application Date: 2010-11-08
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Publication No.: US08525521B2Publication Date: 2013-09-03
- Inventor: Kazuya Yamamoto , Tomoyuki Asada , Miyo Miyashita
- Applicant: Kazuya Yamamoto , Tomoyuki Asada , Miyo Miyashita
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: JP2010-023029 20100204
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R25/02

Abstract:
A detector circuit for detecting degradation in the distortion characteristics of a power amplifier based on signals from both ends of a coupled line of a directional coupler. The detector circuit includes a phase shifter/attenuator for phase shifting and attenuating a signal from a coupled terminal of the coupled line, a differential amplifier for outputting difference between an output signal from the phase shifter/attenuator and a signal from the isolated terminal of the coupled line, a wave detector circuit for converting the difference into a DC signal, and a comparing circuit for determining whether the voltage level of the DC signal exceeds a predetermined level. When degradation in the distortion characteristics of the power amplifier arises, the phase shifter/attenuator phase shifts the signal from the coupled terminal and outputs a signal 180° out of phase with the signal from the isolated terminal.
Public/Granted literature
- US08558549B2 Detector circuit and semiconductor device using same Public/Granted day:2013-10-15
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