Invention Grant
- Patent Title: Conductivity test jig, conductivity test apparatus having conductivity test jig, and a method of testing conductivity
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Application No.: US12292516Application Date: 2008-11-20
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Publication No.: US08525525B2Publication Date: 2013-09-03
- Inventor: Akira Sugiyama , Hiroshi Takeuchi
- Applicant: Akira Sugiyama , Hiroshi Takeuchi
- Applicant Address: JP Tokyo
- Assignee: Yazaki Corporation
- Current Assignee: Yazaki Corporation
- Current Assignee Address: JP Tokyo
- Agency: Edwards Wildman Palmer LLP
- Agent James E. Armstrong, IV; Stephen D. LeBarron
- Priority: JP2007-304225 20071126
- Main IPC: G01R31/04
- IPC: G01R31/04

Abstract:
The conductivity test jig includes: a jig main body; a holding member; a conductivity test unit; a conductivity member; an air cylinder; a jig main body; and a second air cylinder. The jig main body has a hole for receiving the connector. The holding member holds the connector in the hole. The conductivity test unit is detachably attached to the connector. When the conductivity test unit moves close to the connector, the conductivity member is electrically connected to the terminals of the connector. The air cylinder makes the conductivity test unit contact the connector, and removes the conductivity test unit from the connector. The push-out member is interposed between the connector and the jig main body in an insertion direction of the connector in the hole. The second air cylinder moves the push-out member in the insertion direction.
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