Invention Grant
- Patent Title: Method and apparatus for probe contacting
- Patent Title (中): 用于探针接触的方法和装置
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Application No.: US13058861Application Date: 2009-07-23
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Publication No.: US08525537B2Publication Date: 2013-09-03
- Inventor: Kazuhiro Morita , Kaoru Umemura
- Applicant: Kazuhiro Morita , Kaoru Umemura
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge P.C.
- Priority: JP2008-208827 20080814
- International Application: PCT/JP2009/063159 WO 20090723
- International Announcement: WO2010/018739 WO 20100218
- Main IPC: G01R31/20
- IPC: G01R31/20

Abstract:
There is provided a method and a device for accurately detecting the contact of a mechanical probe with a contact object. The contact detecting device comprises a mechanical probe movable for being in contact with a contacted object, a charged particle beam source which generates a charged particle beam applied to the contacted object, a detector for detecting secondary particles or reflected particles from the contacted object, a calculating device which calculates, from a detection signal from the detector, a feature quantity of a shadow of the mechanical probe projected on the contacted object, and a control device which controls the operation of the mechanical probe. The calculating device calculates, as the feature quantity of the shadow of the mechanical probe, a shadow depth S(x, y), and obtains an evaluation value J(z), showing a distance between the contacted object and the mechanical probe, based on the shadow depth S(x, y).
Public/Granted literature
- US20110133765A1 METHOD AND APPARATUS FOR PROBE CONTACTING Public/Granted day:2011-06-09
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