Invention Grant
- Patent Title: Return loss measurement system
- Patent Title (中): 回波损耗测量系统
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Application No.: US12748742Application Date: 2010-03-29
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Publication No.: US08525981B2Publication Date: 2013-09-03
- Inventor: David Zhi Chen , Vijay Jain
- Applicant: David Zhi Chen , Vijay Jain
- Applicant Address: US NJ Basking Ridge
- Assignee: Verizon Patent and Licensing Inc.
- Current Assignee: Verizon Patent and Licensing Inc.
- Current Assignee Address: US NJ Basking Ridge
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A method may include injecting a test signal having a first optical launch power into a device under test via an optical splitter. The optical splitter includes at least two upstream ports and a downstream port and the test signal is injected in a first upstream port of the optical splitter. The device under test is coupled to the downstream port. Return loss associated with the device under test is measured at a second upstream input of the optical splitter. The RL measurement in stored a database. The injecting, measuring, and storing are repeated for a number of different optical launch powers.
Public/Granted literature
- US20110235023A1 RETURN LOSS MEASUREMENT SYSTEM Public/Granted day:2011-09-29
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