Invention Grant
- Patent Title: Apparatus for measuring rotationally symmetric aspheric surface
- Patent Title (中): 用于测量旋转对称非球面的装置
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Application No.: US13108475Application Date: 2011-05-16
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Publication No.: US08526009B2Publication Date: 2013-09-03
- Inventor: Nobuaki Ueki
- Applicant: Nobuaki Ueki
- Applicant Address: JP Tokyo
- Assignee: Fujifilm Corporation
- Current Assignee: Fujifilm Corporation
- Current Assignee Address: JP Tokyo
- Agency: Young & Thompson
- Priority: JP2010-113580 20100517
- Main IPC: G01B11/02
- IPC: G01B11/02 ; G01B9/02

Abstract:
A low coherent light from a white light source is emitted to a sample surface. A detour distance in a detour section is adjusted such that an optical path difference between a reference light and a sample light is equal to or shorter than a coherence length of interference light. The interference light is incident on an image sensor only when an inclination angle of a diffraction grating plate and a wavelength of the interference light satisfy a predetermined condition. Thus, an interference fringe image is formed. Based on each of the interference fringe images taken on a wavelength-by-wavelength basis of the interference light and an optical distance between a reference surface and the sample surface along an optical path of a measuring light at the time of taking the interference fringe image, a shape of the sample surface is measured.
Public/Granted literature
- US20110279823A1 APPARATUS FOR MEASURING ROTATIONALLY SYMMETRIC ASPHERIC SURFACE Public/Granted day:2011-11-17
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