Invention Grant
US08526233B2 Ramping pass voltage to enhance channel boost in memory device, with optional temperature compensation
有权
斜坡通过电压可增强存储器件的通道升压,并可选择温度补偿
- Patent Title: Ramping pass voltage to enhance channel boost in memory device, with optional temperature compensation
- Patent Title (中): 斜坡通过电压可增强存储器件的通道升压,并可选择温度补偿
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Application No.: US13113786Application Date: 2011-05-23
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Publication No.: US08526233B2Publication Date: 2013-09-03
- Inventor: Gerrit Jan Hemink , Shih-Chung Lee , Anubhav Khandelwal , Henry Chin , Guirong Liang , Dana Lee
- Applicant: Gerrit Jan Hemink , Shih-Chung Lee , Anubhav Khandelwal , Henry Chin , Guirong Liang , Dana Lee
- Applicant Address: US TX Plano
- Assignee: SanDisk Technologies Inc.
- Current Assignee: SanDisk Technologies Inc.
- Current Assignee Address: US TX Plano
- Agency: Vierra Magen Marcus LLP
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
In a non-volatile storage system, one or more substrate channel regions for an unselected NAND string are boosted during programming to inhibit program disturb. A voltage applied to one or more unselected word lines associated with at least a first channel region is increased during a program pulse time period in which a program pulse is applied to a selected word line. The increase can be gradual, in the form of a ramp, or step-wise. The boosting level of the first channel region can be maintained. The increase in the voltage applied to the one or more unselected word lines can vary with temperature as well. Before the program pulse time period, the voltage applied to the one or more unselected word lines can be ramped up at a faster rate for a second, adjacent channel region than for the first channel region, to help isolate the channel regions.
Public/Granted literature
- US20120300550A1 Ramping Pass Voltage To Enhance Channel Boost In Memory Device, With Optional Temperature Compensation Public/Granted day:2012-11-29
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