Invention Grant
- Patent Title: Variable resistance memory device and related method of operation
- Patent Title (中): 可变电阻存储器件及相关操作方法
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Application No.: US13026456Application Date: 2011-02-14
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Publication No.: US08526258B2Publication Date: 2013-09-03
- Inventor: Deok-kee Kim , Ho Jung Kim
- Applicant: Deok-kee Kim , Ho Jung Kim
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2010-0023371 20100316
- Main IPC: G11C7/02
- IPC: G11C7/02

Abstract:
A variable resistance memory device comprises a memory cell comprising a variable resistance device and a select transistor connected in series to the variable resistance device. The variable resistance memory device further comprises a write driver for supplying a write voltage to opposite sides of the memory cell, and a feedback circuit for detecting a resistance change of the variable resistance device and controlling a gate voltage of the select transistor according to the detected resistance change.
Public/Granted literature
- US20110228585A1 VARIABLE RESISTANCE MEMORY DEVICE AND RELATED METHOD OF OPERATION Public/Granted day:2011-09-22
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