Invention Grant
- Patent Title: Systems and methods for measuring I-Q mismatch
- Patent Title (中): 用于测量I-Q不匹配的系统和方法
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Application No.: US13114178Application Date: 2011-05-24
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Publication No.: US08526533B2Publication Date: 2013-09-03
- Inventor: Shreyas Sen , Shyam Kumar Devarakond , Abhijit Chatterjee
- Applicant: Shreyas Sen , Shyam Kumar Devarakond , Abhijit Chatterjee
- Applicant Address: US GA Atlanta
- Assignee: Georgia Tech Research Corporation
- Current Assignee: Georgia Tech Research Corporation
- Current Assignee Address: US GA Atlanta
- Agency: Troutman Sanders LLP
- Agent Dustin B. Weeks, Esq.; Ryan A. Schneider, Esq.
- Main IPC: H04L25/03
- IPC: H04L25/03

Abstract:
An exemplary embodiment of the present invention provides a method of measuring I-Q mismatch in a system having a transmitter. The transmitter comprises an in-phase up-converter, a quadrature-phase up-converter, and a power detector. The method of measuring I-Q mismatch comprises measuring an in-phase transmit power at the power detector caused by transmitting an in-phase output signal to the in-phase up-converter, measuring a quadrature-phase transmit power at the power detector caused by transmitting a quadrature-phase output signal to the quadrature-phase up-converter, calculating a transmitter-gain-mismatch as a function of the in-phase transmit power and the quadrature-phase transmit power, measuring an I-Q transmit power at the power detector caused by simultaneously transmitting a gain-mismatch-compensated in-phase output signal to the in-phase up-converter and a gain-mismatch-compensated quadrature-phase output signal to the quadrature-phase up-converter, and calculating a transmitter-phase-mismatch as a function of the I-Q transmit power.
Public/Granted literature
- US20120140807A1 SYSTEMS AND METHODS FOR MEASURING I-Q MISMATCH Public/Granted day:2012-06-07
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